Operating procedure for JEOL F High Resolution Analytical SEM. I. Specimen preparation. There are several holders for different kinds of. JEOL JSMF FEG-SEM combines an electron column with semi-in-lens detectors and an in-the- lens Schottky field emission gun, delivering ultrahigh. Your JEOL Field Emission Scanning Electron Microscope JSMF needs an active vibration isolation? We recommend Heavy Load Isolation Solutions.

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Semi-in-lens provides high-resolution observation and analysis High resolution observation and high spatial resolution analysis is achieved through the combination of a semi-in-lens type objective lens that can collimate the electron beam even at low accelerating voltages, and jell in-lens Schottky electron source that provides a stable current over a long service life. University of Cape Town.

The adoption of a High Power Optics irradiation system delivers high-resolution, high-speed, high-accuracy element analysis. In GB mode a bias voltage is applied to the specimen while the electron beam is emitted, allowing top-surface imaging with only several hundred eV of jjeol electron, making meol possible to obtain high resolution images of samples that have been difficult to observe until now.


University of the Free State. Nelson Mandela Metropolitan University.

The microscope integrates a semi in-lens system 7600 high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL’s expertise in imaging and analysis. Skip to main content. Its new User Interface enables easy navigation through imaging and analyzing procedures.

Specifications SEI resolution 1. Installation Examples Installation Examples. Mesoporous silica GB in use specimen exposure energies: Glossary of TEM Terms.

Centre for Proteomics and Genomics Research. Durban University of Technology. Central University of Technology.

SEM: JEOL JSMF | Electron Microscopy Center | NDSU

Dr PA Olubambi Phone: Tshwane University of Technology. Cape Penninsula University of Technology. For high magnification observation. Gentle Beam GB provides top-surface imaging with ultra-low energy incident electrons A Gentle Beam GB mode with better resolution than the normal 76600f is available.

University of the Western Cape. Vaal University of Technology. A semi in-lens SEM with high resolution. Locations Agricultural Research Council. University of Fort Hare. University of South Africa. High Power Optics delivers high-speed, high-precision analysis High Power Optics 7600c adopted for the optical system, providing not only high-resolution imaging, but also stably delivering high-speed, high-precision analysis, including element analysis.

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Sefako Makgato Health Sciences University. South African Astronomical Observatory. University of the Witwatersrand.

JEOL 7600F Schotky field emission scanning electron microscope

It successfully combines ultra-high resolution imaging with optimized analytical functionality. The incorporation of the Gentle Beam jepl top-surface imaging of a specimen at very low energies of several hundred eV. Paper filter GB in use spacimen exposure energies: The JSMF is a state of-the-art thermal field emission gun scanning electron microscope. It incorporates a large specimen chamber.

National Institute for Communicable Diseases.